Virtual metrology in quality control deals with drifts in product quality that occur during non-sampling periods. This approach enables a hundred percent control and improves the precision of statistical control, specially while there is no sampling activity in manufacturing process. The main challenge in virtual metrology is inaccurate predictions. As such, the choice of an appropriate algorithm for prediction is crucial. We compare several algorithms that can be used for prediction in virtual metrology. The comparison over different prediction algorithms is made on a simulated data inspired from virtual metrology application.
Paru en novembre 2014 , 12 pages